Agilent-HSUPA Wireless Test Benches

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This section describes test bench use with typical RF DUTs, improving test benchperformance when certain RF DUT types are used, and improving simulation fidelity. Twosections regarding special attention for Spectum and EVM transmission measurements isalso included.The RF DUT, in general, may be a circuit design with any combination and quantity ofanalog and RF components, transistors, resistors, capacitors, etc.

suitable for simulationwith the Agilent Circuit Envelope simulator. More complex RF circuits will take more timeto simulate and will consume more memory.Test bench simulation time and memory requirements can be considered to be thecombination of the requirements for the baseline test bench measurement with thesimplest RF circuit plus the requirements for a Circuit Envelope simulation for the RF DUTof interest.