Agilent-EDGE Wireless Test Benches

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Test Bench DetailsThe following sections provide details for setting up a test bench, setting measurementparameters for more control of the test bench, simulation measurement displays, andbaseline performance.
Replace the DUT (CktPAwithBias is provided with this template) with an RF DUT that 1.is suitable for this test bench. For information regarding using certain types of DUTs,see RF DUT Limitations for EDGE Wireless Test Benches (edgewtb).Set the Circuit_VAR values that define the power sweep
2.These parameters are used to define a power sweep for the RF signal input tothe DUT so that the PAE measurement can be observed as a function of the DUTinput power.SourcePower_dBm defines the swept variable used by the ParameterSweepcontroller. Configure SweepPlans to define the power sweep. You can add moreSweepPlans as needed.Set the Required Parameters
3.NoteRefer to EDGE_RF_PAE (edgewtb) for a complete list of parameters for this test bench.Generally, default values can be accepted; otherwise, values can be changed by theuser as needed. Set CE_TimeStep.Cosimulation occurs between the test bench (using Agilent ADS Ptolemy DataFlow simulation technology) and the DUT (using Circuit Envelope simulationtechnology).
Each technology requires its own simulation time step with time-step coordination occurring in the interface between the technologies.CE_TimeStep defines the Circuit Envelope simulation time step to be used withthis DUT. The CE_TimeStep must be set to a value equal to or a submultiple of(less than) WTB_TimeStep; otherwise, simulation will stop and an errormessage will be displayed.